Rongo Univesity Library

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1.
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Power-constrained testing of VLSI circuits by Nicolici, Nicola. Publication: Boston : Kluwer Academic Publishers, 2003 . xi, 178 p. : Date: 2003 Availability: No items available:

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ESD failure mechanisms and models / by Voldman, Steven H. Publication: Chichester, West Sussex, U.K. ; | Hoboken, NJ : J. Wiley, 2009 . xxiv, 384 p. Date: 2009 Availability: No items available:

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On-chip ESD protection for integrated circuits an IC design perspective / by Wang, Albert Z. H., Publication: Boston, Mass. : Kluwer Academic, 2002 . xvi, 303 p. : Date: 2002 Availability: No items available:

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ESD design and synthesis / by Voldman, Steven H. Publication: Chichester, West Sussex, U.K. : Wiley, 2011 . xx, 270 p. : Date: 2011 Availability: No items available:

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5.
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Power-constrained testing of VLSI circuits by Nicolici, Nicola. Publication: Boston : Kluwer Academic Publishers, 2003 . xi, 178 p. : Date: 2003 Availability: No items available:

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6.
No cover image available
ESD failure mechanisms and models / by Voldman, Steven H. Publication: Chichester, West Sussex, U.K. ; | Hoboken, NJ : J. Wiley, 2009 . xxiv, 384 p. Date: 2009 Availability: No items available:

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7.
No cover image available
On-chip ESD protection for integrated circuits an IC design perspective / by Wang, Albert Z. H., Publication: Boston, Mass. : Kluwer Academic, 2002 . xvi, 303 p. : Date: 2002 Availability: No items available:

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8.
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ESD design and synthesis / by Voldman, Steven H. Publication: Chichester, West Sussex, U.K. : Wiley, 2011 . xx, 270 p. : Date: 2011 Availability: No items available:

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