Rongo Univesity Library catalog › Results of search for 'su:Semiconductors and su:Testing.'

Your search returned 13 results.

	1.	No cover image available Power-constrained testing of VLSI circuits by Nicolici, Nicola. Publication: Boston : Kluwer Academic Publishers, 2003 . xi, 178 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	2.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	3.	No cover image available ESD failure mechanisms and models / by Voldman, Steven H. Publication: Chichester, West Sussex, U.K. ; \| Hoboken, NJ : J. Wiley, 2009 . xxiv, 384 p. Date: 2009 Availability: No items available: Add to cart (remove)
	4.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	5.	No cover image available Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan. Publication: Boston : Artech House, 2010 . xv, 198 p. : Date: 2010 Availability: No items available: Add to cart (remove)
	6.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)
	7.	No cover image available Microelectronic failure analysis desk reference. 2002 supplement / Publication: Materials Park, OH : ASM International, 2002 . vi, 210 p. : Date: 2002 Availability: No items available: Add to cart (remove)
	8.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	9.	No cover image available Power-constrained testing of VLSI circuits by Nicolici, Nicola. Publication: Boston : Kluwer Academic Publishers, 2003 . xi, 178 p. : Date: 2003 Availability: No items available: Add to cart (remove)
	10.	No cover image available ESD failure mechanisms and models / by Voldman, Steven H. Publication: Chichester, West Sussex, U.K. ; \| Hoboken, NJ : J. Wiley, 2009 . xxiv, 384 p. Date: 2009 Availability: No items available: Add to cart (remove)
	11.	No cover image available Microelectronic failure analysis desk reference : 2001 supplement / Publication: Materials Park, OH : ASM International, 2001 . v, 171 p. : Date: 2001 Availability: No items available: Add to cart (remove)
	12.	No cover image available Wafer-level testing and test during burn-in for integrated circuits by Bahukudumbi, Sudarshan. Publication: Boston : Artech House, 2010 . xv, 198 p. : Date: 2010 Availability: No items available: Add to cart (remove)
	13.	No cover image available Microelectronics failure analysis desk reference / Publication: Materials Park, Ohio : ASM International, 2011 . xi, 660 p. : Date: 2011 Availability: No items available: Add to cart (remove)

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